Low-Frequency Noises and DLTS Studies in HgCdTe MWIR Photodiodes
| Autor: | Alexandre Brunner, G. Reimbold, P. Guinedor, D. Bauza, David Billon-Lanfrey, Laurent Rubaldo |
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| Přispěvatelé: | SOFRADIR (Veurey-Voroize), Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC ), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019]), Centre National de la Recherche Scientifique (CNRS), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Thèse CIFRE SOFRADIR/IMEP-LAHC/LETI, Bauza, Daniel, CIFRE |
| Rok vydání: | 2019 |
| Předmět: |
Deep-level transient spectroscopy
Materials science Solid-state physics Infrared [SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics HgCdTe 02 engineering and technology Low frequency RTS 01 natural sciences Signal law.invention law 0103 physical sciences Materials Chemistry [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics Electrical and Electronic Engineering HOT 010302 applied physics dislocation DLTS business.industry 1/f noise 021001 nanoscience & nanotechnology Condensed Matter Physics Electronic Optical and Magnetic Materials Photodiode Wavelength Optoelectronics Dislocation 0210 nano-technology business |
| Zdroj: | The U.S. Workshop on the Physics and Chemistry of II-VI Materials The U.S. Workshop on the Physics and Chemistry of II-VI Materials, Oct 2018, Passadena-CA, United States Journal of Electronic Materials Journal of Electronic Materials, Institute of Electrical and Electronics Engineers, 2019, 48 (10), pp.6113-6117. ⟨10.1007/s11664-019-07213-7⟩ Journal of Electronic Materials, 2019, 48 (10), pp.6113-6117. ⟨10.1007/s11664-019-07213-7⟩ |
| ISSN: | 1543-186X 0361-5235 |
| Popis: | International audience; Both low frequency noises and electrically active defects have been investigated for two technological variants, i.e. optimized and non-optimized, of the HgCdTe p on n technology applied to the mid wave infrared (MWIR) blue band with a cutoff wavelength of 4.2 µm. This has been achieved using electro-optical characterizations and the deep level transient spectroscopy (DLTS) technique. The results show that the impact of extra 1/f and random telegraph signal (RTS) noises has been reduced with the optimization of the technology. Furthermore, a broadened DLTS peak, probably related to dislocations in the material, has been found for both variants, the relative amplitude of which is reduced in the optimized case. The potential correlation between low frequency noises and this broadened peak is discussed. |
| Databáze: | OpenAIRE |
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