patRoon 2.0: Non-target screening workflows for automated transformation product screening and other major improvements

Autor: Rick Helmus, Bas van de Velde, Andrea M. Brunner, Maarten R. van Bommel, Thomas L. ter Laak, Pim de Voogt, Annemarie P. van Wezel, Emma L. Schymanski
Rok vydání: 2022
Předmět:
DOI: 10.5281/zenodo.6965893
Popis: Poster presentation about the patRoon 2.0/2.1 release presented during the IMSC 2022 conference in Maastricht
Databáze: OpenAIRE