X-ray reflection topographic study of growth defect and microindentation strain fields in an RDX explosive crystal

Autor: K. C. Yoo, R. W. Armstrong, R. Y. Yee, W. L. Elban, R. G. Rosemeier
Rok vydání: 1989
Předmět:
Zdroj: Journal of Materials Science. 24:1273-1280
ISSN: 1573-4803
0022-2461
DOI: 10.1007/bf02397058
Popis: A reasonably perfect cyclotrimethylenetrinitramine (RDX) explosive crystal has been studied by surface reflection (Berg-Barrett) X-ray topography for the purpose of further elucidating the microstructural basis for hot spots forming in secondary explosives. Topographs were obtained through the base (¯2 1 0) surface of a crystal grown by slow evaporation from an acetone solution. (¯7 2¯1) and (¯6 3¯2) reflections have revealed the central strain field of a large growth defect. This type of defect is proposed to be a suitable internal obstacle for triggering dislocation pile-up collapse during crystal deformation and fracture. Also, extremely localized plastic deformation zones were revealed at Knoop microindentations employed to measure the hardness anisotropy in the (¯2 1 0) crystal surface. A combination of restricted slip systems and cracking is responsible for the significant anisotropy.
Databáze: OpenAIRE
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