Micrometric Growth Defects of DLC Thin Films
| Autor: | Roland Oltra, Pascal Tristant, Cédric Jaoul, O. Jarry, Frederic Meunier, Thibault Maerten, Christophe Le Niniven, Patrice Duport |
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| Přispěvatelé: | Oerlikon, IRCER - Axe 2 : procédés plasmas et lasers (IRCER-AXE2), Institut de Recherche sur les CERamiques (IRCER), Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Laboratoire Interdisciplinaire Carnot de Bourgogne (LICB), Université de Bourgogne (UB)-Centre National de la Recherche Scientifique (CNRS) |
| Jazyk: | angličtina |
| Rok vydání: | 2019 |
| Předmět: |
Materials science
Diamond-like carbon chemistry.chemical_element 02 engineering and technology Chemical vapor deposition engineering.material 01 natural sciences diamond-like carbon thin film growth defect electrochemical tests corrosion Corrosion law.invention [SPI.MAT]Engineering Sciences [physics]/Materials Coating Optical microscope law 0103 physical sciences Thin film Composite material Dissolution 010302 applied physics General Medicine [CHIM.MATE]Chemical Sciences/Material chemistry 021001 nanoscience & nanotechnology chemistry engineering 0210 nano-technology Carbon |
| Zdroj: | C — Journal of Carbon Research C — Journal of Carbon Research, 2019, 5 (4), pp.73. ⟨10.3390/c5040073⟩ C; Volume 5; Issue 4; Pages: 73 |
| DOI: | 10.3390/c5040073⟩ |
| Popis: | International audience; Defects in diamond-like carbon coatings deposited on corrosion sensitive 100Cr6 steel have been studied. Diamond-like carbon (DLC) thin films are promising for corrosion protection due to chemical inertness and low electrical conductivity. Nevertheless, the performance of these coating is highly sensitive to the presence of uncoated areas. These defects represent the primary way of substrate degradation in aggressive environments. An in situ optical microscopy coupled to an electrochemical activation was developed to reveal micrometric growth defects and observe that they were at the origin of corrosion. A square wave voltammetry was applied to increase the sensitivity of electrochemical techniques based on the detection of the dissolution of the bare metal surface triggered by the presence of uncoated spots. This method can be utilized to quantify defect density arising from vapor deposition processes. |
| Databáze: | OpenAIRE |
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