Evaluation of TEM methods for their signature of the number of layers in mono- and few-layer TMDs as exemplified by MoS2 and MoTe2
| Autor: | Janis Köster, Alexander Storm, Tatiana E. Gorelik, Michael J. Mohn, Fabian Port, Manuel R. Gonçalves, Ute Kaiser |
|---|---|
| Přispěvatelé: | European Union (EU), Horizon 2020 |
| Jazyk: | angličtina |
| Rok vydání: | 2022 |
| Předmět: |
HRTEM
Momentum-resolved EELS General Physics and Astronomy MoTe2 Plasmon Two-dimensional materials Plasmons (Physics) Structural Biology DDC 620 / Engineering & allied operations General Materials Science Electron energy loss spectroscopy Plasmon dispersion Elektronen-Energieverlustspektroskopie Molybdändisulfid DDC 500 / Natural sciences & mathematics Zweidimensionales Material Cell Biology Ab-initio calculations 3D electron diffraction Durchstrahlungselektronenmikroskopie ddc:500 ddc:620 MoS2 Specimen thickness Transmission electron microscopy Molybdenum disulphide |
| Popis: | In mono- and few-layer 2D materials, the exact number of layers is a critical parameter, determining the materials’ properties and thus their performance in future nano-devices. Here, we evaluate in a systematic manner the signature of exfoliated free-standing mono- and few-layer MoS₂ and MoTe₂ in TEM experiments such as high-resolution transmission electron microscopy, electron energy-loss spectroscopy, and 3D electron diffraction. A reference for the number of layers has been determined by optical contrast and AFM measurements on a substrate. Comparing the results, we discuss strengths and limitations, benchmarking the three TEM methods with respect to their ability to identify the exact number of layers. publishedVersion |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|