Effect of dielectric barrier on rectification, injection and transport properties of printed organic diodes
| Autor: | Sampo Tuukkanen, Mika Valden, Himadri S. Majumdar, Timo Joutsenoja, Donald Lupo, Ronald Österbacka, Kaisa E. Lilja, Petri Heljo, Kimmo Lahtonen |
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| Přispěvatelé: | Department of Electronics, Tampere University of Technology [Tampere] (TUT), Center for Functional Materials, Åbo Academy University, Tampere University, Optoelectronics Research Centre, Research group: Surface Science, Augmented Human Activities (AHA), Frontier Photonics |
| Jazyk: | angličtina |
| Rok vydání: | 2011 |
| Předmět: |
Materials science
Acoustics and Ultrasonics Analytical chemistry chemistry.chemical_element 02 engineering and technology 114 Physical sciences 01 natural sciences Barrier layer Rectification X-ray photoelectron spectroscopy 0103 physical sciences Diode 010302 applied physics business.industry 213 Electronic automation and communications engineering electronics 021001 nanoscience & nanotechnology Condensed Matter Physics Copper Surfaces Coatings and Films Electronic Optical and Magnetic Materials Dielectric spectroscopy Semiconductor chemistry Physical Sciences Optoelectronics 0210 nano-technology business Layer (electronics) |
| Zdroj: | Journal of Physics D: Applied Physics Journal of Physics D: Applied Physics, IOP Publishing, 2011, 44 (29), pp.295301. ⟨10.1088/0022-3727/44/29/295301⟩ |
| ISSN: | 0022-3727 1361-6463 |
| DOI: | 10.1088/0022-3727/44/29/295301⟩ |
| Popis: | Rectification ratios of 105 were observed in printed organic copper/polytriarylamine (PTAA)/silver diodes with a thin insulating barrier layer at the copper/PTAA interface. To clarify the origin of the high rectification ratio in the diodes, the injection, transport and structure of the diodes with two different copper cathodes were examined using impedance spectroscopy and x-ray photoelectron spectroscopy (XPS). The impedance data confirm that the difference in diode performance arises from the copper/PTAA interface. The XPS measurements show that the copper surface in both diode structures is covered by a layer of Cu2O topped by an organic layer. The organic layer is thicker on one of the surfaces, which results in lower reverse currents and higher rectification ratios in the printed diodes. We suggest a model where a dipole at the dual insulating layer induces a shift in the semiconductor energy levels explaining the difference between the diodes with different cathodes. |
| Databáze: | OpenAIRE |
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