Recent Trends and Perspectives on Defect-Oriented Testing
| Autor: | Bernardi, P., Cantoro, R., Coyette, A., Dobbeleare, W., Fieback, M., Floridia, A., Gielen, G., Gomez, J., Grosso, M., Guerriero, A. M., Guglielminetti, I., Hamdioui, S., Insinga, G., Mautone, N., Mirabella, N., Sartoni, S., Reorda, M. Sonza, Ullmann, R., Vanhooren, R., Xama, N., Wu, L. |
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| Přispěvatelé: | Savino, A, Rech, P, DiCarlo, S, Gizopoulos, D |
| Jazyk: | angličtina |
| Rok vydání: | 2022 |
| Předmět: |
DPPM
Technology Science & Technology Computer Science Information Systems Engineering Electrical & Electronic non-volatile memories emerging technologies Engineering cell-aware test DPPB Computer Science device-aware test Computer Science Hardware & Architecture Flash data analytics visual inspection |
| Zdroj: | 2022 IEEE 28th International Symposium on Testing and Robust System Design (IOLTS) |
| Popis: | ispartof: 2022 IEEE 28TH INTERNATIONAL SYMPOSIUM ON ON-LINE TESTING AND ROBUST SYSTEM DESIGN (IOLTS 2022) ispartof: 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) location:ITALY, Politecnico Torino, Torino date:12 Sep - 14 Sep 2022 status: published |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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