Full optical characterization of single nanoparticles using quantitative phase imaging
| Autor: | Daniel Andrén, Nicolas Bonod, Samira Khadir, Guillaume Baffou, Patrick C. Chaumet, Serge Monneret, Anne Sentenac, Mikael Käll |
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| Přispěvatelé: | MOSAIC (MOSAIC), Institut FRESNEL (FRESNEL), Aix Marseille Université (AMU)-École Centrale de Marseille (ECM)-Centre National de la Recherche Scientifique (CNRS)-Aix Marseille Université (AMU)-École Centrale de Marseille (ECM)-Centre National de la Recherche Scientifique (CNRS), Aix Marseille Université (AMU)-École Centrale de Marseille (ECM)-Centre National de la Recherche Scientifique (CNRS), CLARTE (CLARTE), Chalmers University of Technology [Göteborg], Centre National de la Recherche Scientifique (CNRS)-École Centrale de Marseille (ECM)-Aix Marseille Université (AMU)-Centre National de la Recherche Scientifique (CNRS)-École Centrale de Marseille (ECM)-Aix Marseille Université (AMU), Centre National de la Recherche Scientifique (CNRS)-École Centrale de Marseille (ECM)-Aix Marseille Université (AMU) |
| Jazyk: | angličtina |
| Rok vydání: | 2020 |
| Předmět: |
Point spread function
Wavefront [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics] Materials science business.industry Scattering Nanophotonics 02 engineering and technology 021001 nanoscience & nanotechnology 01 natural sciences Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials 010309 optics Interferometry Optics 0103 physical sciences Light beam 0210 nano-technology business Image resolution Plasmon |
| Zdroj: | Optica Optica, Optical Society of America (OSA), 2020, 7 (3), pp.243. ⟨10.1364/OPTICA.381729⟩ Optica, Optical Society of America-OSA Publishing, 2020, 7 (3), pp.243. ⟨10.1364/OPTICA.381729⟩ Optica, 2020, 7 (3), pp.243. ⟨10.1364/OPTICA.381729⟩ |
| ISSN: | 2334-2536 |
| DOI: | 10.1364/OPTICA.381729⟩ |
| Popis: | International audience; This paper introduces a procedure aimed to quantitatively measure the optical properties of nanoparticles, namely the complex polarizability and the extinction, scattering, and absorption cross sections, simultaneously. The method is based on the processing of intensity and wavefront images of a light beam illuminating the nanoparticle of interest. Intensity and wavefront measurements are carried out using quadriwave lateral shearing interferometry, a quantitative phase imaging technique with high spatial resolution and sensitivity. The method does not require any preknowledge on the particle and involves a single interferogram image acquisition. The full determination of the actual optical properties of nanoparticles is of particular interest in plasmonics and nanophotonics for the active search and characterization of new materials, e.g., aimed to replace noble metals in future applications of nanoplasmonics with less-lossy or refractory materials. |
| Databáze: | OpenAIRE |
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