Structural, morphologic and optical characterization of In(2−x)Al x S3
| Autor: | N. Kamoun Turki, R. Bennaceur, F. Saadallah, Noureddine Yacoubi, C. Guasch, N. Jebbari |
|---|---|
| Přispěvatelé: | Laboratoire de Physique de la Matière Condensée (LPMC), Centre National de la Recherche Scientifique (CNRS), IPEIN (Institut Préparatoire aux Etudes d'Ingénieurs de Nabeul), Université de Carthage - University of Carthage, Institut d’Electronique et des Systèmes (IES), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Radiations et composants (RADIAC), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Laboratoire de Physique de la matière Condensée [Tunis] (LPMC), Université de Tunis El Manar (UTM)-Faculté des Sciences Mathématiques, Physiques et Naturelles de Tunis (FST), Université de Tunis El Manar (UTM) |
| Jazyk: | angličtina |
| Rok vydání: | 2014 |
| Předmět: |
Diffraction
Materials science Scanning electron microscope Analytical chemistry chemistry.chemical_element General Chemistry Substrate (electronics) Grain size Characterization (materials science) [SPI.TRON]Engineering Sciences [physics]/Electronics chemistry Aluminium General Materials Science Thin film Indium ComputingMilieux_MISCELLANEOUS |
| Zdroj: | Applied physics. A, Materials science & processing Applied physics. A, Materials science & processing, Springer Verlag, 2014, 116 (4), pp.2011-2017. ⟨10.1007/s00339-014-8387-2⟩ |
| ISSN: | 0947-8396 1432-0630 |
| DOI: | 10.1007/s00339-014-8387-2⟩ |
| Popis: | Aluminum-doped indium sulfide thin films are deposited on glass by spray pyrolysis technique. The structure and the surface morphology of these films were characterized by X-ray diffraction and atomic force microscopy. The effects of aluminum ratio z and substrate temperature Ts, on the film structure and grain size are discussed. The influence of aluminum ratio on surface morphology is revealed by scanning electron microscope. Besides, energy dispersive spectrometry technique is used to compare atomic aluminum concentration in the film with aluminum ratio z in spray solution. Optical properties are studied by a spectrophotometer in the wavelength range 350–850 nm, at room temperature. Optical transmission and grain size are found to be maximal for z = 1.8 %. Moreover, band-gap energy is found to increase with aluminum ratio. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|
Full text from SpringerLink