Surface chemical characterization using XPS and ToF-SIMS of latex particles prepared by the emulsion copolymerization of methacrylic acid and styrene
| Autor: | J. F. Watts, A. J. Paul, John C. Vickerman, J. Hearn, R. A. P. Lynn, M. C. Davies |
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| Předmět: |
Surfaces and Interfaces
Condensed Matter Physics Mass spectrometry Polyelectrolyte Styrene Secondary ion mass spectrometry chemistry.chemical_compound Electrophoresis chemistry Methacrylic acid X-ray photoelectron spectroscopy Polymer chemistry Electrochemistry Particle General Materials Science Spectroscopy Nuclear chemistry |
| Zdroj: | Scopus-Elsevier |
| Popis: | A series of colloids based on poly(styrene) were prepared by emulsion copolymerization with various proportions of methacrylic acid. X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) were used to monitor changes in particle surface composition and indicated a substantial enrichment of the methacrylic acid component. Further evidence for the presence of carboxyl groups at the particle surfaces was provided by electrophoretic mobility measurements, which showed a marked increase over the pH range studied. |
| Databáze: | OpenAIRE |
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