Local Strain Distribution in ZnO Microstructures Visualized with Scanning Nano X���Ray Diffraction and Impact on Electrical Properties

Autor: Stjepan Hrkac, Lorenz Kienle, Christina Krywka, Rainer Adelung, Philipp Jordt, Jorit Gröttrup, Niklas Wolff, Bridget M. Murphy, Olaf M. Magnussen, Anton Davydok
Jazyk: angličtina
Rok vydání: 2021
Předmět:
Zdroj: Jordt, P.; Hrkac, S.; Gröttrup, J.; Davydok, A.; Krywka, C.; Wolff, N.; Kienle, L.; Adelung, R.; Magnussen, O.; Murphy, B.: Local Strain Distribution in ZnO Microstructures Visualized with Scanning Nano X-Ray Diffraction and Impact on Electrical Properties. In: Advanced Engineering Materials. Vol. 23 (2021) 11, 2100201. (DOI: /10.1002/adem.202100201)
Advanced engineering materials 23(11), 2100201 (2021). doi:10.1002/adem.202100201 special issue: "Neutrons and Synchrotron Radiation-Unique Tools for the Characterization of Materials"
ISSN: 1438-1656
DOI: 10.3204/pubdb-2021-02254
Popis: Advanced engineering materials 23(11), 2100201 (2021). doi:10.1002/adem.202100201 special issue: "Neutrons and Synchrotron Radiation - Unique Tools for the Characterization of Materials"
The fast and contact-free detection of biomagnetic vital signs can benefit clinical diagnostics in medical care, emergency services, and scientific studies, hugely. A highly sensitive magnetoelectric sensor for the detection of biomagnetic signals combined with the piezotronic effect is a promising path to increase the signal detection limit. Herein, the results of three ZnO microrods examined by nano X-ray diffraction and current���voltage curves to investigate the crystalline structure influence on the Schottky contact properties are presented. The measurements reveal different strain distributions for the three rods and that these are linked with the electrical properties, showing that the crystalline quality has a direct influence on the Schottky contact properties. An analytical model is created to determine the influence of the stress. Although rotation of the strain orientation changes the strain appearance in the measurement, it does not affect the Schottky contact properties.
Published by Deutsche Gesellschaft fu��r Materialkunde, Frankfurt, M.
Databáze: OpenAIRE
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