Electron optics for a multi-pass transmission electron microscope
| Autor: | Brannon B. Klopfer, Mark A. Kasevich, Stewart A. Koppell, Thomas Juffmann, Marian Mankos, Vladimir Kolarik, Khashayar Shadman |
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| Jazyk: | angličtina |
| Rok vydání: | 2019 |
| Předmět: |
0303 health sciences
Range (particle radiation) Materials science business.industry Electron optics Electron mirror Detector Resolution (electron density) Phase (waves) Multi-pass electron microscopy 02 engineering and technology Electron 021001 nanoscience & nanotechnology 03 medical and health sciences Optics Transmission electron microscopy Cathode ray Cryo-electron microscopy 0210 nano-technology business 030304 developmental biology |
| Zdroj: | Advances in Imaging and Electron Physics Advances in Imaging and Electron Physics-Advances in Imaging and Electron Physics Including Proceedings CPO-10 Advances in Imaging and Electron Physics Including Proceedings CPO-10 |
| ISSN: | 1076-5670 |
| Popis: | Multi-pass transmission electron microscopy is a novel technique that promises to reduce the required electron dose to the specimen for a desired signal-to-noise ratio by increasing the change to the phase of the electron wave that is imparted by the specimen. In this technique, the electron beam interacts elastically with the specimen multiple times so that the change in the phase accumulates before reaching the detector. Past simulations have predicted an improvement in resolution and sensitivity for a range of applications, and an order-of-magnitude reduction in damage at equivalent resolution. Here, the electron-optical design of a 10 keV multi-pass transmission electron microscope that is currently under construction is examined. |
| Databáze: | OpenAIRE |
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