High purity x-ray polarimetry with single-crystal diamond
| Autor: | Hendrik Bernhardt, T. Kämpfer, Eckhart Förster, Benjamin Grabiger, Gerhard G. Paulus, Ingo Uschmann, Thomas Stöhlker, Johann Haber, Berit Marx-Glowna, R. Loetzsch, Carsten Detlefs, K. S. Schulze, Ralf Röhlsberger |
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| Jazyk: | angličtina |
| Rok vydání: | 2016 |
| Předmět: |
Materials science
Physics and Astronomy (miscellaneous) business.industry Polarimetry Bragg's law Diamond Synchrotron radiation Polarimeter 02 engineering and technology Undulator Polarizer engineering.material 021001 nanoscience & nanotechnology 01 natural sciences Synchrotron law.invention Optics law 0103 physical sciences engineering ddc:530 010306 general physics 0210 nano-technology business |
| Zdroj: | Applied physics letters 109(12), 121106 (2016). doi:10.1063/1.4962806 |
| DOI: | 10.1063/1.4962806 |
| Popis: | Applied physics letters 109(12), 121106(2016). doi:10.1063/1.4962806 We report on the use of synthetic single-crystal diamonds for high purity x-ray polarimetry to improve the polarization purity of present-day x-ray polarimeters. The polarimeter setup consists of a polarizer and an analyzer, each based on two parallel diamond crystals used at a Bragg angle close to 45°. The experiment was performed using one (400) Bragg reflection on each diamond crystal and synchrotron undulator radiation at an x-ray energy of 9838.75 eV. A polarization purity of 8.9 × 10$^{−10}$ was measured at the European Synchrotron Radiation Facility, which is the best value reported for two-reflection polarizer/analyzer setups. This result is encouraging and is a first step to improve the resolution of x-ray polarimeters further by using diamond crystal polarizers and analyzers with four or six consecutive reflections. Published by American Inst. of Physics, Melville, NY |
| Databáze: | OpenAIRE |
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