Study of waveguide background at visible wavelengths for on-chip nanoscopy
| Autor: | Hallvard Angelskår, James S. Wilkinson, Carlos Domínguez, Øystein Ivar Helle, Ganapathy Senthil Murugan, David A. Coucheron, Balpreet Singh Ahluwalia |
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| Jazyk: | angličtina |
| Rok vydání: | 2021 |
| Předmět: |
Materials science
FOS: Physical sciences 02 engineering and technology 01 natural sciences law.invention 010309 optics symbols.namesake Optics Optical microscope law 0103 physical sciences Microscopy Total internal reflection business.industry VDP::Technology: 500 021001 nanoscience & nanotechnology Atomic and Molecular Physics and Optics Wavelength VDP::Teknologi: 500 symbols 0210 nano-technology business Waveguide Raman scattering Excitation Visible spectrum Optics (physics.optics) Physics - Optics |
| Zdroj: | 20735-20746 Optics Express |
| Popis: | On-chip super-resolution optical microscopy is an emerging field relying on waveguide excitation with visible light. Here, we investigate two commonly used high-refractive index waveguide platforms, tantalum pentoxide (Ta2O5) and silicon nitride (Si3N4), with respect to their background with excitation in the range 488–640 nm. The background strength from these waveguides were estimated by imaging fluorescent beads. The spectral dependence of the background from these waveguide platforms was also measured. For 640 nm wavelength excitation both the materials had a weak background, but the background increases progressively for shorter wavelengths for Si3N4. We further explored the effect of the waveguide background on localization precision of single molecule localization for direct stochastic optical reconstruction microscopy (dSTORM). An increase in background for Si3N4 at 488 nm is shown to reduce the localization precision and thus the resolution of the reconstructed images. The localization precision at 640nm was very similar for both the materials. Thus, for shorter wavelength applications Ta2O5 is preferable. Reducing the background from Si3N4 at shorter wavelengths via improved fabrication will be worth pursuing. |
| Databáze: | OpenAIRE |
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