Fabrication of flexible polymer–GaN core–shell nanofibers by the combination of electrospinning and hollow cathode plasma-assisted atomic layer deposition

Autor: Asli Celebioglu, Necmi Biyikli, Cagla Ozgit-Akgun, Seda Kizir, Ali Haider, Sesha Vempati, Fatma Kayaci, Eda Goldenberg, Tamer Uyar
Přispěvatelé: Uyar, Tamer, Bıyıklı, Necmi
Rok vydání: 2015
Předmět:
Low processing temperature
Cathodes
Materials science
Polymers
X ray diffraction
Processing temperature
X ray photoelectron spectroscopy
Nanofibers
Pulsed laser deposition
Average fiber diameters
Nanotechnology
Energy dispersive X ray analysis
Processing
X ray analysis
Zinc sulfide
Atomic layer deposition
Electron diffraction
X-ray photoelectron spectroscopy
Optoelectronic applications
Ceramic materials
Electron microscopy
Materials Chemistry
Shells (structures)
Ceramic
Deposition
Electrodes
Polycrystalline wurtzite
Wurtzite crystal structure
Dynamic mechanical analysis
Electrospinning
Photoluminescence measurements
Temperature
Spinning (fibers)
Gallium nitride
General Chemistry
Selected area electron diffraction
Chemical engineering
High performance material
Nanofiber
visual_art
visual_art.visual_art_medium
Selected area diffraction
Layer (electronics)
Transmission electron microscopy
Electron sources
Zdroj: Journal of Materials Chemistry C
ISSN: 2050-7534
2050-7526
DOI: 10.1039/c5tc00343a
Popis: Here we demonstrate the combination of electrospinning and hollow cathode plasma-assisted atomic layer deposition (HCPA-ALD) processes by fabricating flexible polymer-GaN organic-inorganic core-shell nanofibers at a processing temperature much lower than that needed for the preparation of conventional GaN ceramic nanofibers. Polymer-GaN organic-inorganic core-shell nanofibers fabricated by the HCPA-ALD of GaN on electrospun polymeric (nylon 6,6) nanofibers at 200 °C were characterized in detail using electron microscopy, energy dispersive X-ray analysis, selected area electron diffraction, X-ray diffraction, X-ray photoelectron spectroscopy, photoluminescence measurements, and dynamic mechanical analysis. Although transmission electron microscopy studies indicated that the process parameters should be further optimized for obtaining ultimate uniformity and conformality on these high surface area 3D substrates, the HCPA-ALD process resulted in a ∼28 nm thick polycrystalline wurtzite GaN layer on polymeric nanofibers of an average fiber diameter of ∼70 nm. Having a flexible polymeric core and low processing temperature, these core-shell semiconducting nanofibers might have the potential to substitute brittle ceramic GaN nanofibers, which have already been shown to be high performance materials for various electronic and optoelectronic applications.
Databáze: OpenAIRE