Orthogonal beam ballistic backscatter stimulated Raman microscopy
Autor: | Robert D. Frankel |
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Rok vydání: | 2019 |
Předmět: |
Microscope
Materials science Backscatter Scanning electron microscope business.industry Forward scatter 02 engineering and technology 021001 nanoscience & nanotechnology 01 natural sciences Atomic and Molecular Physics and Optics law.invention 010309 optics Wavelength symbols.namesake Optics law 0103 physical sciences Bessel beam symbols 0210 nano-technology business Raman spectroscopy Beam (structure) |
Zdroj: | Optics express. 27(16) |
ISSN: | 1094-4087 |
Popis: | When the axial gain length of a stimulated Raman microscope is less than about 40% of the emission wavelength significant dipole-like ballistic backscatter will occur. Here we analyze a scanning microscope configured with orthogonal water dipping pump and probe objectives that satisfies this criterion. The pump beam focus may be a Gaussian spot or a droplet Bessel beam which minimizes the secondary Bessel beam lobes and provides multiple simultaneous pump focal spot regions. Radial and linearly polarized pump beams enable backscattered polarized signals along both transverse axes of the probe beam. Low level Mie backscatter is the primary photon noise source which should enable rapid sub-wavelength resolution 3-dimensional imaging of label-free Raman contrast for in-vivo pathology, as well as, imaging physiologic concentrations of Raman labelled metabolites and drugs. |
Databáze: | OpenAIRE |
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