Simultaneous multi-dimensional spatial frequency modulation imaging
| Autor: | Jeff Squier, John Czerski, Nathan Worts, Jeffrey J. Field, Jason Jones, Randy A. Bartels |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2020 |
| Předmět: |
lcsh:Applied optics. Photonics
Computer science single element detection enhanced resolution ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION 02 engineering and technology 01 natural sciences 010309 optics Quality (physics) 0103 physical sciences Electronic engineering lcsh:TA401-492 Advanced manufacturing Electrical and Electronic Engineering Instrumentation Manufacturing process Mechanical Engineering imaging lcsh:TA1501-1820 021001 nanoscience & nanotechnology Modulation Multi dimensional spatial frequency modulation lcsh:Materials of engineering and construction. Mechanics of materials Spatial frequency nonlinear imaging 0210 nano-technology |
| Zdroj: | International Journal of Optomechatronics, Vol 14, Iss 1, Pp 1-17 (2020) |
| ISSN: | 1559-9620 1559-9612 |
| Popis: | One of the primary challenges in advanced manufacturing (AM) is the lack of efficient optical metrics for ensuring quality control over the manufacturing process. Many current imaging techniques have excessive data requirements and require computationally intensive post-processing to effectively characterize various AM environments. Spatial frequency modulated imaging (SPIFI) addresses many of these issues with the following benefits: it is compatible with long working distance optics, provides a large field-of-view, features single element detection, and can provide enhanced resolution. Here, we demonstrate SPIFI with enhanced resolution in multiple dimensions for the first time. This is achieved by incorporating multiple linear extended excitation sources oriented with axes at arbitrary angles with respect to each other. The system utilizes a single modulation mask enabling facile implementation within existing imaging systems such as those found in laser AM systems. |
| Databáze: | OpenAIRE |
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