Relation between substrate surface morphology and microcrystalline silicon solar cell performance
| Autor: | Arvind Shah, Christophe Ballif, Julien Bailat, Didier Domine, L. Fesquet, Evelyne Vallat-Sauvain, M. Python |
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| Rok vydání: | 2008 |
| Předmět: |
Materials science
Silicon business.industry chemistry.chemical_element Substrate (electronics) Photovoltaic effect Condensed Matter Physics Electronic Optical and Magnetic Materials law.invention Optics chemistry Photovoltaics Transmission electron microscopy Saturation current law Scanning transmission electron microscopy Solar cell Materials Chemistry Ceramics and Composites Composite material business |
| Zdroj: | Journal of Non-Crystalline Solids. 354:2258-2262 |
| ISSN: | 0022-3093 |
| Popis: | In the present paper, the structural and electrical performances of microcrystalline silicon (μc-Si:H) single junction solar cells co-deposited on a series of substrates having different surface morphologies varying from V-shaped to U-shaped valleys, are analyzed. Transmission electron microscopy (TEM) is used to quantify the density of cracks within the cells deposited on the various substrates. Standard 1 sun, variable illumination measurements (VIM) and Dark J(V) measurements are performed to evaluate the electrical performances of the devices. A marked increase of the reverse saturation current density (J0) is observed for increasing crack densities. By introducing a novel equivalent circuit taking into account such cracks as non-linear shunts, the authors are able to relate the magnitude of the decrease of Voc and FF to the increasing density of cracks. |
| Databáze: | OpenAIRE |
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