In situ x-ray diffraction analysis of 2D crack patterning in thin films
Autor: | Pierre-Olivier Renault, Damien Faurie, T. Sadat, Dominique Thiaudière, Guillaume Parry, Fatih Zighem, Pierre Godard |
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Přispěvatelé: | Laboratoire des Sciences des Procédés et des Matériaux (LSPM), Université Paris 13 (UP13)-Institut Galilée-Université Sorbonne Paris Cité (USPC)-Centre National de la Recherche Scientifique (CNRS), Institut Pprime (PPRIME), Université de Poitiers-ENSMA-Centre National de la Recherche Scientifique (CNRS), Surface, Interfaces et MAtériaux sous Contrainte SIMAC (SIMAC), Département Physique et Mécanique des Matériaux (Département Physique et Mécanique des Matériaux), Université de Poitiers-ENSMA-Centre National de la Recherche Scientifique (CNRS)-Université de Poitiers-ENSMA-Centre National de la Recherche Scientifique (CNRS)-Institut Pprime (PPRIME), Université de Poitiers-ENSMA-Centre National de la Recherche Scientifique (CNRS)-Université de Poitiers-ENSMA-Centre National de la Recherche Scientifique (CNRS), Science et Ingénierie des Matériaux et Procédés (SIMaP ), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019]), Synchrotron SOLEIL (SSOLEIL), Centre National de la Recherche Scientifique (CNRS) |
Rok vydání: | 2019 |
Předmět: |
Diffraction
Digital image correlation Cracks Materials science Polymers and Plastics [PHYS.MPHY]Physics [physics]/Mathematical Physics [math-ph] Mechanical properties 02 engineering and technology Substrate (electronics) 01 natural sciences Synchrotron [SPI.AUTO]Engineering Sciences [physics]/Automatic [PHYS.QPHY]Physics [physics]/Quantum Physics [quant-ph] 0103 physical sciences [PHYS.MECA.MEFL]Physics [physics]/Mechanics [physics]/Fluid mechanics [physics.class-ph] [PHYS.MECA.BIOM]Physics [physics]/Mechanics [physics]/Biomechanics [physics.med-ph] Composite material Thin film Plane stress [SPI.ACOU]Engineering Sciences [physics]/Acoustics [physics.class-ph] [PHYS.MECA.VIBR]Physics [physics]/Mechanics [physics]/Vibrations [physics.class-ph] 010302 applied physics [SPI.FLUID]Engineering Sciences [physics]/Reactive fluid environment [SPI.NRJ]Engineering Sciences [physics]/Electric power Metals and Alloys [CHIM.MATE]Chemical Sciences/Material chemistry [PHYS.MECA.MSMECA]Physics [physics]/Mechanics [physics]/Materials and structures in mechanics [physics.class-ph] 021001 nanoscience & nanotechnology [PHYS.MECA.ACOU]Physics [physics]/Mechanics [physics]/Acoustics [physics.class-ph] Electronic Optical and Magnetic Materials Stress field [SPI.ELEC]Engineering Sciences [physics]/Electromagnetism [CHIM.POLY]Chemical Sciences/Polymers Flexible substrates X-ray crystallography [PHYS.MECA.THER]Physics [physics]/Mechanics [physics]/Thermics [physics.class-ph] Ceramics and Composites Deformation (engineering) 0210 nano-technology |
Zdroj: | Acta Materialia Acta Materialia, Elsevier, 2019, 165, pp.177-182. ⟨10.1016/j.actamat.2018.11.040⟩ |
ISSN: | 1359-6454 |
Popis: | International audience; In this work, the effect of the loading path on the multicracking of Nickel thin films on Kapton® substrate was studied thanks to an experimental set-up combining controlled biaxial deformation, x-ray diffraction and digital image correlation. Samples were biaxially stretched up to 10% strain following either a single equibiaxial path or a complex one consisting of loading successively along each of the axes of the cruciform specimen. While the first path leads to a mud-crack pattern (random), the second leads to a roman-bricks one (square). Moreover, the in situ x-ray diffraction experiments show that the stress field developed in the thin film during the multicracking is clearly dependent on the loading path. By combining the study of stresses and x-ray diffraction peaks linewidth, we evidenced mechanical domains related to initiation of cracks and their multiplication for each loading path. Moreover, stress evolution in the thin film during mud-crack pattern formation is significantly smoother than in the case of roman-bricks one as represented in the plane stress space. |
Databáze: | OpenAIRE |
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