Strong three-dimensional field localization and enhancement on deep sinusoidal gratings with two-dimensional periodicity
| Autor: | Evgeny Popov, John Hoose, Jérôme Wenger, Svetlen Tonchev |
|---|---|
| Přispěvatelé: | CLARTE (CLARTE), Institut FRESNEL (FRESNEL), Centre National de la Recherche Scientifique (CNRS)-École Centrale de Marseille (ECM)-Aix Marseille Université (AMU)-Centre National de la Recherche Scientifique (CNRS)-École Centrale de Marseille (ECM)-Aix Marseille Université (AMU), MOSAIC (MOSAIC), Richardson Gratings, Newport, Rochester (RGL), Newport, USA, Richardson Grating Lab, Rochester (RGL), Popov, Evgeni, Aix Marseille Université (AMU)-École Centrale de Marseille (ECM)-Centre National de la Recherche Scientifique (CNRS)-Aix Marseille Université (AMU)-École Centrale de Marseille (ECM)-Centre National de la Recherche Scientifique (CNRS) |
| Rok vydání: | 2013 |
| Předmět: |
[PHYS.PHYS.PHYS-OPTICS] Physics [physics]/Physics [physics]/Optics [physics.optics]
Diffraction Materials science Light Physics::Optics Surface plasmons Grating 01 natural sciences 010309 optics Optics Electric field 0103 physical sciences Scattering Radiation Computer Simulation 010306 general physics Diffraction grating [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics] Subwavelength structures business.industry Surface plasmon Diffraction gratings Equipment Design Models Theoretical Atomic and Molecular Physics and Optics Equipment Failure Analysis Refractometry Surface wave Computer-Aided Design business Excitation Localized surface plasmon |
| Zdroj: | Optics Letters Optics Letters, Optical Society of America-OSA Publishing, 2013, 38 (22), pp.4876 Optics Letters, 2013, 38 (22), pp.4876 |
| ISSN: | 1539-4794 0146-9592 |
| DOI: | 10.1364/ol.38.004876 |
| Popis: | International audience; The study of total light absorption due to excitation of localized surface plasmons on deep metallic crossed gratings having a sinusoidal profile with a two-dimensional periodicity shows a very strong increase in the electric field intensity, reaching 800 times the incident intensity. The region with high intensity is strongly localized at the groove top and is characterized by a volume much smaller than the diffraction limit, both in transverse direction along the grating plane, and in longitudinal direction when going away from the grating surface. The field enhancement and its localization are much more pronounced than in shallow gratings. |
| Databáze: | OpenAIRE |
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