Continuous-wave Z-scan measurement of photorefractive SBN:60
| Autor: | Detlef Breitling, Azad Siahmakoun, Reza A. Najaf-Zadeh |
|---|---|
| Rok vydání: | 2008 |
| Předmět: |
Materials science
business.industry Materials Science (miscellaneous) Physics::Optics Photorefractive effect Polarization (waves) Laser Industrial and Manufacturing Engineering Organic photorefractive materials law.invention Wavelength Optics law Attenuation coefficient Continuous wave Z-scan technique Business and International Management business |
| Zdroj: | Applied optics. 39(29) |
| ISSN: | 1559-128X |
| Popis: | A cw-probe Z-scan technique was employed to measure the photoinduced index change in a photorefractive SBN:60 crystal. For this experiment a three-detector data-acquisition system was used to account for temporal changes in the laser. The effects of various beam parameters such as intensity, polarization, and wavelength were studied. A theoretical simulation of the Z scan based on a band-transport model of photorefractive-index variation was also developed. This model provides reasonable agreement with the experimental results. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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