Autor: |
J. Penfold, R. C. Ward, S. Messoloras, N. M. Harwood, R. J. Stewart |
Jazyk: |
angličtina |
Rok vydání: |
2016 |
Předmět: |
|
Popis: |
The neutron reflectivity from 30 Pt/C bilayers on an Si substrate has been measured using the time-of-flight (TOF) technique. The thickness of the bilayers, the total thickness of the multilayer structure and the density of the carbon and platinum layers are determined. The influence on the reflectivity curve of different types of multilayer-substrate and air-multilayer interfaces are examined. The experimental data are fitted with a reflectivity curve calculated by using a smoothly varying density profile between the multilayer structure and the substrate. |
Databáze: |
OpenAIRE |
Externí odkaz: |
|