Very high broadband electromagnetic characterization method of film-shaped materials using coplanar
| Autor: | S. Lepilliet, Kamal Lmimouni, Juan Hinojosa, G. Dambrine |
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| Přispěvatelé: | Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF) |
| Rok vydání: | 2002 |
| Předmět: |
Permittivity
Engineering business.industry 020208 electrical & electronic engineering Isotropy 020206 networking & telecommunications 02 engineering and technology Substrate (electronics) Dielectric Condensed Matter Physics 7. Clean energy Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Characterization (materials science) Optics Line (geometry) Broadband 0202 electrical engineering electronic engineering information engineering Electronic engineering Electrical and Electronic Engineering business Microwave |
| Zdroj: | Microwave and Optical Technology Letters Microwave and Optical Technology Letters, Wiley, 2002, 33, pp.352-355 Microwave and Optical Technology Letters, 2002, 33, pp.352-355 |
| ISSN: | 1098-2760 0895-2477 |
| DOI: | 10.1002/mop.10319 |
| Popis: | A very high broadband method for determining the electromagnetic properties of isotropic film-shaped materials, which uses coplanar lines as cells, is presented. The material tested is the coplanar line substrate. The complex properties are computed from S-parameter measurements of coplanar cells propagating the dominant mode and using analytical relationships, which decrease the computation time. Vector network analyzers and high-quality on-coplanar test fixtures are used for the measurement bench. Measurements for several dielectric materials in the 0.05–110 GHz frequency range show good agreements between measured and predicted data. © 2002 Wiley Periodicals, Inc. Microwave Opt Technol Lett 33: 352–355, 2002; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10319 |
| Databáze: | OpenAIRE |
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