High-resolution inelastic x-ray scattering at the high energy density scientific instrument at the European X-Ray Free-Electron Laser
| Autor: | C. Plückthun, Sebastian Göde, Karen Appel, Benjamin K. Ofori-Okai, C. Strohm, Ulf Zastrau, Adrien Descamps, Andrew Comley, Gianluca Gregori, Ingo Uschmann, O. Karnbach, Charlotte Palmer, Lennart Wollenweber, Oliver Humphries, Ronald Redmer, David McGonegle, Justin Wark, Thomas G. White, Luke Fletcher, Jerome B. Hastings, A. Jenei, G. Geloni, Giulio Monaco, Berit Marx-Glowna, Zuzana Konôpková, Jon Eggert, R. Loetzsch, Thomas Tschentscher, Valerio Cerantola, S. H. Glenzer, Dirk O. Gericke, T. R. Preston, Emma McBride, I. Thorpe |
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| Přispěvatelé: | Wollenweber, L, Preston, T, Descamps, A, Cerantola, V, Comley, A, Eggert, J, Fletcher, L, Geloni, G, Gericke, D, Glenzer, S, G??de, S, Hastings, J, Humphries, O, Jenei, A, Karnbach, O, Konopkova, Z, Loetzsch, R, Marx-Glowna, B, Mcbride, E, Mcgonegle, D, Monaco, G, Ofori-Okai, B, Palmer, C, Pl??ckthun, C, Redmer, R, Strohm, C, Thorpe, I, Tschentscher, T, Uschmann, I, Wark, J, White, T, Appel, K, Gregori, G, Zastrau, U |
| Jazyk: | angličtina |
| Rok vydání: | 2021 |
| Předmět: |
Spectrum analyzer
Materials science Inelastic scattering 01 natural sciences monochromator 010305 fluids & plasmas law.invention Optics law 0103 physical sciences Spectral resolution Instrumentation Monochromator 010302 applied physics business.industry Scattering XFEL Resolution (electron density) Free-electron laser Laser ddc:620 business IXS |
| Zdroj: | Review of scientific instruments 92(1), 013101 (2021). doi:10.1063/5.0022886 Wollenweber, L, Preston, T R, Descamps, A, Cerantola, V, Comley, A, Eggert, J H, Fletcher, L B, Geloni, G, Gericke, D O, Glenzer, S H, Göde, S, Hastings, J, Humphries, O S, Jenei, A, Karnbach, O, Konopkova, Z, Loetzsch, R, Marx-Glowna, B, McBride, E E, McGonegle, D, Monaco, G, Ofori-Okai, B K, Palmer, C A J, Plückthun, C, Redmer, R, Strohm, C, Thorpe, I, Tschentscher, T, Uschmann, I, Wark, J S, White, T G, Appel, K, Gregori, G & Zastrau, U 2021, ' High-resolution inelastic x-ray scattering at the high energy density scientific instrument at the European X-Ray Free-Electron Laser ', Review of Scientific Instruments, vol. 92, no. 1, 013101 . https://doi.org/10.1063/5.0022886 |
| DOI: | 10.1063/5.0022886 |
| Popis: | Review of scientific instruments 92(1), 013101 (2021). doi:10.1063/5.0022886 We introduce a setup to measure high-resolution inelastic x-ray scattering at the High Energy Density scientific instrument at the European X-Ray Free-Electron Laser (XFEL). The setup uses the Si (533) reflection in a channel-cut monochromator and three spherical diced analyzer crystals in near-backscattering geometry to reach a high spectral resolution. An energy resolution of 44 meV is demonstrated for the experimental setup, close to the theoretically achievable minimum resolution. The analyzer crystals and detector are mounted on a curved-rail system, allowing quick and reliable changes in scattering angle without breaking vacuum. The entire setup is designed for operation at 10 Hz, the same repetition rate as the high-power lasers available at the instrument and the fundamental repetition rate of the European XFEL. Among other measurements, it is envisioned that this setup will allow studies of the dynamics of highly transient laser generated states of matter. Published by American Institute of Physics, [S.l.] |
| Databáze: | OpenAIRE |
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