Resonant soft X-ray scattering for polymer materials

Autor: Feng Liu, Cheng Wang, Michael A. Brady
Rok vydání: 2016
Předmět:
Zdroj: Liu, F; Brady, MA; & Wang, C. (2016). Resonant soft X-ray scattering for polymer materials. European Polymer Journal, 81, 555-568. doi: 10.1016/j.eurpolymj.2016.04.014. Lawrence Berkeley National Laboratory: Retrieved from: http://www.escholarship.org/uc/item/7v08v7x3
ISSN: 0014-3057
DOI: 10.1016/j.eurpolymj.2016.04.014
Popis: © 2016 Resonant Soft X-ray Scattering (RSoXS) was developed over the last a few years, and the first dedicated resonant soft X-ray scattering beamline for soft materials was constructed at the Advanced Light Source, LBNL. RSoXS combines soft X-ray spectroscopy with X-ray scattering and thus offers statistical information for 3D chemical morphology over a large length scale range from nanometers to micrometers. Using RSoXS to characterize multi-length scale soft materials with heterogeneous chemical structures, we have demonstrated that soft X-ray scattering is a unique complementary technique to conventional hard X-ray and neutron scattering. Its unique chemical sensitivity, large accessible size scale, molecular bond orientation sensitivity with polarized X-rays, and high coherence have shown great potential for chemically specific structural characterization for many classes of materials.
Databáze: OpenAIRE