Advanced experimental applications for x-ray transmission gratings Spectroscopy using a novel grating fabrication method
| Autor: | Gilad Hurvitz, Y. Ehrlich, Z. Shpilman, Moshe Fraenkel, G. Strum, I. Levy |
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| Jazyk: | angličtina |
| Rok vydání: | 2012 |
| Předmět: |
Fabrication
Materials science business.industry FOS: Physical sciences Physics::Optics Grating Spectral line Physics - Plasma Physics Plasma Physics (physics.plasm-ph) Quality (physics) Optics Transmission (telecommunications) Transmission electron microscopy business Spectroscopy Instrumentation Diffraction grating Optics (physics.optics) Physics - Optics |
| Popis: | A novel fabrication method for soft x-ray transmission grating and other optical elements is presented. The method uses Focused-Ion-Beam (FIB) technology to fabricate high-quality free standing grating bars on Transmission Electron Microscopy grids (TEM-grid). High quality transmission gratings are obtained with superb accuracy and versatility. Using these gratings and back-illuminated CCD camera, absolutely calibrated x-ray spectra can be acquired for soft x-ray source diagnostics in the 100-3000 eV spectral range. Double grating combinations of identical or different parameters are easily fabricated, allowing advanced one-shot application of transmission grating spectroscopy. These applications include spectroscopy with different spectral resolutions, bandwidths, dynamic ranges, and may serve for identification of high-order contribution, and spectral calibrations of various x-ray optical elements. |
| Databáze: | OpenAIRE |
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