Silver substrates for surface enhanced Raman scattering: Correlation between nanostructure and Raman scattering enhancement
| Autor: | Michael Rübhausen, Peng Zhang, Johannes F. H. Risch, Gonzalo Santoro, Matthias Schwartzkopf, Sarathlal Koyiloth Vayalil, Concepción Domingo, Stephan V. Roth, Shun Yu, Margarita Hernández |
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| Rok vydání: | 2014 |
| Předmět: |
Raman scattering
Nanostructure Silver Physics and Astronomy (miscellaneous) Silicon business.industry Scattering Analytical chemistry chemistry.chemical_element Sputter deposition Nanofabrication symbols.namesake chemistry Nanosensor symbols Thin film growth Optoelectronics Thin film Raman spectroscopy business Surface enhanced |
| Zdroj: | Digital.CSIC. Repositorio Institucional del CSIC instname |
| Popis: | The fabrication of substrates for Surface Enhanced Raman Scattering (SERS) applications matching the needs for high sensitive and reproducible sensors remains a major scientific and technological issue. We correlate the morphological parameters of silver (Ag) nanostructured thin films prepared by sputter deposition on flat silicon (Si) substrates with their SERS activity. A maximum enhancement of the SERS signal has been found at the Ag percolation threshold, leading to the detection of thiophenol, a non-resonant Raman probe, at concentrations as low as 10-10M, which corresponds to enhancement factors higher than 7 orders of magnitude. To gain full control over the developed nanostructure, we employed the combination of in-situ time-resolved microfocus Grazing Incidence Small Angle X-ray Scattering with sputter deposition. This enables to achieve a deepened understanding of the different growth regimes of Ag. Thereby an improved tailoring of the thin film nanostructure for SERS applications can be realized. © 2014 AIP Publishing LLC. |
| Databáze: | OpenAIRE |
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