Analysis of methylation-sensitive amplified polymorphism in wheat genome under the wheat leaf rust stress

Autor: Li-Na Feng, Sheng-Jie Fu, Hui Wang, Yi Sun, Wen-Xiang Yang, Da-Qun Liu
Rok vydání: 2009
Předmět:
Zdroj: Hereditas (Beijing). 31:297-304
ISSN: 0253-9772
DOI: 10.3724/sp.j.1005.2009.002597
Popis: Intrinsic DNA methylation pattern is an integral component of the epigenetic network in many eukaryotes. DNA methylation plays an important role in regulating gene expression in eukaryotes. Biological stress in plant provides an inherent epigenetic driving force of evolution. Study of DNA methylation patterns arising from biological stress will help us fully understand the epigenetic regulation of gene expression and DNA methylation of biological functions. The wheat near-isogenic lines TcLr19 and TcLr41 were resistant to races THTT and TKTJ, respectively, and Thatcher is compatible in the interaction with Puccinia triticina THTT and TKTJ, respectively. By means of methylation-sensitive amplified polymorphism (MSAP) analysis, the patterns of cytosine methylation in TcLr19, TcLr41, and Thatcher inoculated with P. triticina THTT and TKTJ were compared with those of the untreated samples. All the DNA fragments, each representing a recognition site cleaved by each or both of isoschizomers, were amplified using 60 pairs of selective primers. The results indicated that there was no significant difference between the challenged and unchallenged plants at DNA methylation level. However, epigenetic difference between the near-isogenic line for wheat leaf rust resistance gene Lr41 and Thatcher was present.
Databáze: OpenAIRE