Conditioning nano-LEDs in arrays by laser-micro-annealing: The key to their performance improvement
| Autor: | St. Trellenkamp, Hilde Hardtdegen, A. Winden, J. Moers, Dagmar Gregušová, Martin Mikulics, Peter Kordos, Joachim Mayer, Zdeněk Sofer |
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| Rok vydání: | 2021 |
| Předmět: |
010302 applied physics
Photoluminescence Fabrication Materials science Physics and Astronomy (miscellaneous) business.industry Optical power 02 engineering and technology Electroluminescence 021001 nanoscience & nanotechnology Laser 01 natural sciences law.invention law 0103 physical sciences Optoelectronics Continuous wave ddc:530 0210 nano-technology business Diode Light-emitting diode |
| Zdroj: | Applied physics letters 118(4), 043101-(2021). doi:10.1063/5.0038070 |
| ISSN: | 1077-3118 0003-6951 |
| Popis: | A local so-called laser-micro-annealing (LMA) conditioning technology, which is suitable for the fabrication of a large range of hybrid nano-optoelectronic devices, was applied to III-nitride-based nano-light emitting diodes (LEDs). The LEDs with a diameter of ∼100 nm were fabricated in large area arrays and designed for hybrid optoelectronic applications. The LMA process was developed for the precise local conditioning of LED nano-structures. Photoluminescence measurements reveal the enhancement of nano-LED properties, which is in very good agreement with a simple model introduced based on the reduction of the defect layer depth by the LMA process. The experimental data confirm the reduction of the defect layer depth from ∼17 nm to ∼5 nm determined. In consequence, an increase in work currents up to 40 nA at 5 V bias after the LMA procedure as well as high electroluminescence (EL) and output optical power up to 150 nW in the ∼440–445 nm emission wavelength range corresponding to ∼75% wall-plug efficiency were achieved. Additionally, the LEDs' electroluminescence intensities reach the desired values by conditioning the contact/annealed regions of individual LEDs accordingly. Furthermore, the LMA process affects the long-term stability of the electroluminescence (EL) intensity of single nano-LED devices. A study of the EL during 5000 h in the continuous wave operation testing mode revealed a moderate ∼15% decrease in the intensity in comparison to ∼50% for their non-LMA counterparts. Finally, Raman measurements indicate that the “work” temperature for nano-LED conditioned structures decreases. |
| Databáze: | OpenAIRE |
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