SAT-based capture-power reduction for at-speed broadcast-scan-based test compression architectures
| Autor: | Michael A. Kochte, Miyase, Kohei, Wen, Xiaoqing, Kajihara, Seiji, Yamato, Yuta, Enokimoto, Kazunari, Wunderlich, Hans-Joachim |
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| Rok vydání: | 2011 |
| Předmět: |
power-aware X-filling
ATPG SAT-based capture-power reduction low power devices Computer science X-identification Test compression Automatic test pattern generation power-aware testing VLSI testing Reduction (complexity) test cubes test vectors Low capture-power test at-speed broadcast-scan-based test compression architectures business.industry power dissipation Circuit faults Logic gates Flip-flops VLSI Power (physics) integrated circuit testing Integrated circuit modeling Logic gate low-power electronics power management X-filling business Switches Computer hardware |
| Zdroj: | IEEE/ACM International Symposium on Low Power Electronics and Design. |
| DOI: | 10.1109/islped.2011.5993600 |
| Popis: | Excessive power dissipation during VLSI testing results in over-testing, yield loss and heat damage of the device. For low power devices with advanced power management features and more stringent power budgets, power-aware testing is even more mandatory. Effective and efficient test set postprocessing techniques based on X-identification and power-aware X-filling have been proposed for external and embedded deterministic test. This work proposes a novel X-filling algorithm for combinational and broadcast-scan-based test compression schemes which have great practical significance. The algorithm ensures compressibility of test cubes using a SAT-based check. Compared to methods based on topological justification, the solution space of the compressed test vector is not pruned early during the search. Thus, this method allows much more precise low-power X-filling of test vectors. Experiments on benchmark and industrial circuits show the applicability to capture-power reduction during scan testing. ISLPED : 2011 International Symposium on Low Power Electronics and Design , 1-3 Aug 2011 , Fukuoka, Japan |
| Databáze: | OpenAIRE |
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