Comparison of two alternative junction temperature setting methods aimed for thermal and optical testing of high power LEDs
| Autor: | Janos Hegedus, Andras Poppe, Marton C. Bein, Gabor Farkas, Marta Rencz, Gusztav Hantos, Lajos Gaal |
|---|---|
| Rok vydání: | 2017 |
| Předmět: |
Steady state (electronics)
business.industry Computer science 020209 energy Electrical engineering 02 engineering and technology Semiconductor device 7. Clean energy Temperature measurement Power (physics) law.invention LED lamp law 0202 electrical engineering electronic engineering information engineering Calibration Junction temperature business Light-emitting diode |
| Zdroj: | 2017 23rd International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) |
| DOI: | 10.1109/therminic.2017.8233838 |
| Popis: | Characterization of LEDs and other semiconductor devices demands at least accurate monitoring of the junction temperature (Tj), also its control in more complex cases. In practical LED lighting appliances “hot lumens” are meaningful, as most lamps are used in steady state with power applied. Analysis in cold state provides only indirect information about the intended operation. On the other hand, direct T j measurement is not trivial — the most viable way is to measure the forward voltage (V F ) which is a function of junction temperature. In this paper we compare two ways of V F -based T j regulation of LEDs capable for electrical-optical-thermal characterization in a single session in terms of accuracy and time consumption. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|