Autor: |
Huang, Xiaoheng, Tahvili, Saeed, Kleijn, Emil, Docter, Boudewijn |
Jazyk: |
angličtina |
Rok vydání: |
2018 |
Předmět: |
|
DOI: |
10.5281/zenodo.3237727 |
Popis: |
We report on a semi-automated die-level test and measurement platform which has been designed to support several types of electro-optical measurements. The platform is optimized for repeatability, efficiency and minimal operator interference to enable an unattended collection of large amounts of data. It benefits from in-house developed control algorithms for automatic alignment of a lensed fiber to the optical facet, as well as progressive coordinates-based jogging between test structures. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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