Influence of temperature gradient on diffracted X-ray spectrum in quartz crystal
| Autor: | R. V. Amiragyan, A. V. Vukolov, A R Mkrtchyan, A I Novokshonov, A. P. Potylitsyn, A. S. Gogolev, A. E. Movsisyan |
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| Rok vydání: | 2016 |
| Předmět: |
кварц
Diffraction Spectrometer business.industry Chemistry 05 social sciences Resolution (electron density) рентгеновские спектры X-ray 010403 inorganic & nuclear chemistry 01 natural sciences Spectral line 0104 chemical sciences Crystal Temperature gradient Optics температурные градиенты 0502 economics and business кристаллы business рентгеновские излучения Quartz 050203 business & management |
| Zdroj: | IOP Conference Series: Materials Science and Engineering. 135:012028 |
| ISSN: | 1757-899X 1757-8981 |
| DOI: | 10.1088/1757-899x/135/1/012028 |
| Popis: | In this work characteristics of hard X-ray (with energy higher than 30 keV) were investigated. In the experiment we measured spectra of X-ray reflected by a quartz monocrystal in Laue geometry under influence of the temperature gradient. The measurements were made by the spectrometer BDER-KI-11K with 300 eV resolution on the 17.74 keV spectral line of Am241 and the spectrometer XR-100CR with 270 eV resolution on the same spectral line. An existence of temperature gradient leads to increasing of the diffracted beam intensity. The intensity was measured dependently on the temperature of one of the edge of the crystal. |
| Databáze: | OpenAIRE |
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