A review on IGBT module failure modes and lifetime testing
| Autor: | Mehdi Narimani, Amir Sajjad Bahman, Ahmed Abuelnaga |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2021 |
| Předmět: |
General Computer Science
Computer science Automotive industry Long-term reliability 02 engineering and technology 7. Clean energy 01 natural sciences Reliability (semiconductor) 0103 physical sciences 0202 electrical engineering electronic engineering information engineering General Materials Science Electrical and Electronic Engineering Aerospace degradation 010302 applied physics business.industry 020208 electrical & electronic engineering General Engineering lifetime models Insulated-gate bipolar transistor Reliability engineering Power (physics) IGBT failure modes Logic gate power cycling lcsh:Electrical engineering. Electronics. Nuclear engineering business lcsh:TK1-9971 |
| Zdroj: | Abuelnaga, A, Narimani, M & Bahman, A S 2021, ' A review on IGBT module failure modes and lifetime testing ', IEEE Access, vol. 9, 9316255, pp. 9643-9663 . https://doi.org/10.1109/ACCESS.2021.3049738 IEEE Access, Vol 9, Pp 9643-9663 (2021) |
| DOI: | 10.1109/ACCESS.2021.3049738 |
| Popis: | This article focuses on failure modes and lifetime testing of IGBT modules being one of the most vulnerable components in power electronic converters. IGBT modules have already located themselves in the heart of many critical applications, such as automotive, aerospace, transportation, and energy. They are required to work under harsh operational and environmental conditions for extended target lifetime that may reach 30 to 40 years in some applications. Therefore, addressing the reliability of IGBT modules is of paramount importance. The paper provides a comprehensive review on IGBT modules dominant failure modes, and long-term reliability. A detailed discussion on accelerated testing, and lifetime and degradation characterization considering thermo-mechanical stress is also presented in details. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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