Ion and Electron Ghost Imaging
| Autor: | C. Lopez, Daniel Comparat, A. Trimeche, Y. J. Picard |
|---|---|
| Přispěvatelé: | Picard, Yan, Laboratoire Aimé Cotton (LAC), École normale supérieure - Cachan (ENS Cachan)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS), Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-École normale supérieure - Cachan (ENS Cachan), Laboratoire Lumière, Matière et Interfaces (LuMIn), CentraleSupélec-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS)-Ecole Normale Supérieure Paris-Saclay (ENS Paris Saclay), Laboratoire de l'intégration, du matériau au système (IMS), Centre National de la Recherche Scientifique (CNRS)-Institut Polytechnique de Bordeaux-Université Sciences et Technologies - Bordeaux 1 |
| Rok vydání: | 2020 |
| Předmět: |
Physics - Instrumentation and Detectors
Atomic Physics (physics.atom-ph) FOS: Physical sciences Electron Ghost imaging 01 natural sciences Ion Physics - Atomic Physics 010309 optics Optics [PHYS.QPHY]Physics [physics]/Quantum Physics [quant-ph] Physics::Plasma Physics 0103 physical sciences [PHYS.PHYS.PHYS-INS-DET]Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det] [PHYS.PHYS.PHYS-ATOM-PH] Physics [physics]/Physics [physics]/Atomic Physics [physics.atom-ph] 010306 general physics Image resolution ComputingMilieux_MISCELLANEOUS Physics [PHYS.PHYS.PHYS-ATOM-PH]Physics [physics]/Physics [physics]/Atomic Physics [physics.atom-ph] business.industry Detector Instrumentation and Detectors (physics.ins-det) [PHYS.PHYS.PHYS-GEN-PH]Physics [physics]/Physics [physics]/General Physics [physics.gen-ph] [PHYS.PHYS.PHYS-INS-DET] Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det] business |
| Zdroj: | Physical Review Research Physical Review Research, American Physical Society, 2020, 2 (4), ⟨10.1103/PhysRevResearch.2.043295⟩ Physical Review Research, American Physical Society, 2020, 2 (4), pp.043295. ⟨10.1103/PhysRevResearch.2.043295⟩ HAL |
| ISSN: | 2643-1564 |
| DOI: | 10.48550/arxiv.2003.02186 |
| Popis: | In this Letter, we report a demonstration of ion and electron ghost imaging. Two beams of correlated ions and electrons are produced by a photoionization process and accelerated into opposite directions. Using a single time and position sensitive detector for one beam, we can image an object seen by the other beam even when the detector that sees this object has no spatial resolution. The extra information given by this second detector can, therefore, be used to reconstruct the image thanks to the correlation between the ions and the electrons. In our example, a metallic mask placed in front of a time-sensitive detector is used as the object to image. We demonstrated ion and electron ghost imaging using this mask in a transmission mode. These primary results are very promising and open applications especially in ion and electron imaging in surface science and nanophysics. Comment: 4 pages, 2 figures |
| Databáze: | OpenAIRE |
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