Electrically Driven Light Emission from Individual CdSe Nanowires
| Autor: | Hongkun Park, Chun L. Yu, Yong-Joo Doh, Kristin N. Maher, Jiwoong Park, Lian Ouyang |
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| Rok vydání: | 2008 |
| Předmět: |
Kelvin probe force microscope
Photocurrent Condensed Matter - Materials Science Materials science Condensed Matter - Mesoscale and Nanoscale Physics business.industry Mechanical Engineering Photoconductivity Schottky barrier Nanowire Materials Science (cond-mat.mtrl-sci) FOS: Physical sciences Bioengineering General Chemistry Electroluminescence Condensed Matter Physics Mesoscale and Nanoscale Physics (cond-mat.mes-hall) Optoelectronics General Materials Science Light emission Electrical measurements business |
| DOI: | 10.48550/arxiv.0809.3475 |
| Popis: | We report electroluminescence (EL) measurements carried out on three-terminal devices incorporating individual n-type CdSe nanowires. Simultaneous optical and electrical measurements reveal that EL occurs near the contact between the nanowire and a positively biased electrode or drain. The surface potential profile, obtained by using Kelvin probe microscopy, shows an abrupt potential drop near the position of the EL spot, while the band profile obtained from scanning photocurrent microscopy indicates the existence of an n-type Schottky barrier at the interface. These observations indicate that light emission occurs through a hole leakage or an inelastic scattering induced by the rapid potential drop at the nanowire-electrode interface. Comment: 12 pages, 4 figures |
| Databáze: | OpenAIRE |
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