2020 IEEE 8th Electronics System-Integration Technology Conference (ESTC), 15.-18. 9. 2020

Autor: Vinayak Chavan, Bernhard Czerny, Christoph Gasser, Golta Khatibi, Jordis Rosc
Rok vydání: 2020
Předmět:
Zdroj: 2020 IEEE 8th Electronics System-Integration Technology Conference (ESTC).
DOI: 10.1109/estc48849.2020.9229726
Popis: Two in-situ failure detection methods by measuring acoustic emissions and transducer responses are presented to investigate the wire bond degradation failure during a highly accelerated mechanical fatigue test. This BAMFIT fatigue test is used to induce cyclic shear stresses in the bond interface until wire bond lift-off, operating at 60 kHz. The task was to incorporate non-invasive failure detection to identify the degree of degradation prior to end of life as an extension to the BAMFIT method and a possible quality control method. The acoustic emission investigations uses a Fabry Perot interferometer to detect high frequency emissions in the vicinity of the wire bond and detecting changes in the first three harmonics to identify a bond degradation. The transducer response approach observes systematic changes in the vibration and the damping behavior of the coupled resonance system by using the transducer as a piezo sensor. The results have shown that defective bond interconnect can be identified as early as ~50% of end of life, using high power but very short vibration pulses, and at ~80% for low power and completely non-invasive pulses. The obtained responses from the presented methods were correlated to the degree of degradation of the bond wire interface, by completing BAMFIT tests until end of life, cross section analysis as well as non-destructive X-ray computer tomography. Energie-Umweltmanagement
Databáze: OpenAIRE