Measuring the angular profile of the reflection of xenon scintillation light

Autor:	J. Pinto da Cunha, M.I. Lopes, F. Neves, Pedro Cabral Mendes, C. Silva, V. N. Solovov, A. Pereira, V. Chepel
Jazyk:	angličtina
Rok vydání:	2007
Předmět:	Nuclear and High Energy Physics Physics::Instrumentation and Detectors chemistry.chemical_element Reflectance medicine.disease_cause 01 natural sciences 030218 nuclear medicine & medical imaging 03 medical and health sciences chemistry.chemical_compound 0302 clinical medicine Angular distribution Optics Xenon 0103 physical sciences medicine Instrumentation Xenon scintillation Physics Scintillation Polytetrafluoroethylene 010308 nuclear & particles physics business.industry Copper Reflectivity 3. Good health chemistry Reflection (physics) Optoelectronics Liquid xenon business Ultraviolet
Zdroj:	Repositório Científico de Acesso Aberto de Portugal Repositório Científico de Acesso Aberto de Portugal (RCAAP) instacron:RCAAP
Popis:	A chamber designed for measuring the angular distribution of reflected ultraviolet vacuum light is described. We report first measurements of the reflection profile of xenon scintillation light by a polished copper surface and by polytetrafluoroethylene (PTFE). http://www.sciencedirect.com/science/article/B6TJM-4NTB92C-1/1/01c2ff1d3b516ce3fda2bd84949e2925
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::277e22e7d3b43834d6c5921954b90507 Zobrazit plný text záznamu