A single probe for imaging photons, electrons and physical forces
| Autor: | Hans J. Hug, Stephanie E. Stevenson, Giancarlo Pigozzi, Fabio Lamattina, Rainer H. Fink, Patrycja Paruch, J. Raabe, Yuliya Lisunova, N. Pilet, Christoph Quitmann |
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| Rok vydání: | 2016 |
| Předmět: |
electron
Photon Materials science x-ray microscopy Bioengineering 02 engineering and technology Electron 01 natural sciences Optics scanning force microscopy 0103 physical sciences Microscopy General Materials Science Single probe carbon nanotube Electrical and Electronic Engineering photon detection 010302 applied physics business.industry Mechanical Engineering Detector co-axial tip General Chemistry 021001 nanoscience & nanotechnology Aspect ratio (image) Transmission (telecommunications) Mechanics of Materials scanning probe Coaxial 0210 nano-technology business |
| Zdroj: | NANOTECHNOLOGY |
| ISSN: | 1361-6528 0957-4484 |
| DOI: | 10.1088/0957-4484/27/23/235705 |
| Popis: | The combination of complementary measurement techniques has become a frequent approach to improve scientific knowledge. Pairing of the high lateral resolution scanning force microscopy (SFM) with the spectroscopic information accessible through scanning transmission soft x-ray microscopy (STXM) permits assessing physical and chemical material properties with high spatial resolution. We present progress from the NanoXAS instrument towards using an SFM probe as an x-ray detector for STXM measurements. Just by the variation of one parameter, the SFM probe can be utilised to detect either sample photo-emitted electrons or transmitted photons. This allows the use of a single probe to detect electrons, photons and physical forces of interest. We also show recent progress and demonstrate the current limitations of using a high aspect ratio coaxial SFM probe to detect photo-emitted electrons with very high lateral resolution. Novel probe designs are proposed to further progress in using an SFM probe as a STXM detector. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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