Light scattering in translucent layers: angular distribution and internal reflections at flat interfaces

Autor: Arthur Gautheron, Raphaël Clerc, Vincent Duveiller, Lionel Simonot, Bruno Montcel, Mathieu Hebert
Přispěvatelé: RMN et optique : De la mesure au biomarqueur, Centre de Recherche en Acquisition et Traitement de l'Image pour la Santé (CREATIS), Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-Université de Lyon-Institut National des Sciences Appliquées de Lyon (INSA Lyon), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Hospices Civils de Lyon (HCL)-Université Jean Monnet - Saint-Étienne (UJM)-Institut National de la Santé et de la Recherche Médicale (INSERM)-Centre National de la Recherche Scientifique (CNRS)-Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Hospices Civils de Lyon (HCL)-Université Jean Monnet - Saint-Étienne (UJM)-Institut National de la Santé et de la Recherche Médicale (INSERM)-Centre National de la Recherche Scientifique (CNRS), Laboratoire Hubert Curien [Saint Etienne] (LHC), Institut d'Optique Graduate School (IOGS)-Université Jean Monnet - Saint-Étienne (UJM)-Centre National de la Recherche Scientifique (CNRS), Institut Pprime (PPRIME), Université de Poitiers-ENSMA-Centre National de la Recherche Scientifique (CNRS), GAUTHERON, Arthur
Jazyk: angličtina
Rok vydání: 2022
Předmět:
Zdroj: Electronic Imaging 2022 (EI 2022)
Electronic Imaging 2022 (EI 2022), Jan 2022, San Francisco, United States. pp.221-1-221-6, ⟨10.2352/EI.2022.34.15.COLOR-221⟩
DOI: 10.2352/EI.2022.34.15.COLOR-221⟩
Popis: International audience; Optical characterization and appearance prediction of translucent materials is needed in several fields of engineering such as computer graphics, dental restorations or 3D printing technologies. In the case of strongly diffusing materials, flux transfer models like the Kubelka-Munk model (2-flux) or 4-flux model have been successfully used to this aim for decades. However, they lead to inaccurate prediction of the color variations of translucent objects of different thicknesses. Indeed, as they assume Lambertian fluxes at any depth within the material and in particular at the bordering interfaces, they fail to model the internal reflectance at the interfaces, penalizing the accuracy of the optical parameter extraction. The aim of the paper is to investigate the impact of translucency on light angular distribution and corresponding internal reflectances, by the mean of the radiative transfer equation, which describes more rigorously the impact of the scattering on the light propagation. It turns out that the light angular distribution at the bordering interfaces, assumed to be flat, is far from being Lambertian, and the internal reflectance may vary a lot according to the layer's thickness, refractive index, scattering and absorption coefficients. This work not only enables to better understand the impact of scattering within a translucent layer but also invites to revisit the well-known Saunderson correction used in 2-or 4-flux models.
Databáze: OpenAIRE