Kinetics and the crystallographic structure of bismuth during liquefaction and solidification on an insulating substrate

Autor:	Bollmann, Tjeerd R.J., Jankowski, Maciej
Přispěvatelé:	Inorganic Materials Science, MESA+ Institute
Rok vydání:	2022
Předmět:	Condensed Matter - Materials Science Insulating substrate Materials Chemistry Pulsed laser deposition Materials Science (cond-mat.mtrl-sci) FOS: Physical sciences Surfaces and Interfaces Condensed Matter Physics Bismuth Molecular beam epitaxy Nanodots n/a OA procedure Surfaces Coatings and Films
Zdroj:	Surface science, 723:122106. Elsevier
ISSN:	0039-6028
Popis:	Here we study the kinetics of liquefaction and solidification of thin bismuth films grown on the insulating substrate by the pulsed laser deposited (PLD) and molecular beam epitaxy (MBE) and investigated by in situ electron and X-ray diffraction. By PLD, we can grow films similar to those obtained using MBE, studied by ex-situ AFM, KPFM, XRR, and XRD. The liquefaction-solidification transition is monitored in real-time by RHEED and synchrotron XRD, resulting in a dewetting phenomenon and the formation of spherical droplets which size depends on the initial film thickness. Studying this phase transition in more detail, we find instantaneous liquefaction and solidification, resulting in formation of the nanodots oriented with a (110) crystallographic plane parallel to the substrate. Furthermore, we propose a two-step growth mechanism by analyzing the recorded specular diffraction rods. Overall, we show that the PLD and MBE can be used as a method for the highly controlled growth of Bi nanostructures, including their crystallographic orientation on the substrate. Comment: 39 pages, 20 figures
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::26af3886da08be30f99b7c546350b112 https://doi.org/10.1016/j.susc.2022.122106 Zobrazit plný text záznamu Full Text from ScienceDirect