Quantitative Assessment of the Influence of Camera and Parameter Choice for Outdoor Electroluminescence Investigations of Silicon Photovoltaic Panels
| Autor: | Juergen Parisi, Tobias Pickel, Christian Camus, Claudia Buerhop, Raphael Knecht, Christoph J. Brabec, E. Calderón del Rivero, Bernd Doll, J. Hauch, Johannes Hepp |
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| Rok vydání: | 2019 |
| Předmět: |
010302 applied physics
Thesaurus (information retrieval) Materials science Silicon Photovoltaic system General Physics and Astronomy chemistry.chemical_element 02 engineering and technology Electroluminescence 021001 nanoscience & nanotechnology 01 natural sciences Engineering physics chemistry 0103 physical sciences Quantitative assessment ddc:500 Physical and Theoretical Chemistry 0210 nano-technology Mathematical Physics |
| Zdroj: | Zeitschrift für Naturforschung 74(8), 645-653 (2019). doi:10.1515/zna-2019-0025 |
| ISSN: | 1865-7109 0932-0784 |
| Popis: | With the spread of photovoltaics (PV) and increasing diversity in PV panel technology, quantitative comparison of the modules is highly desirable for consistent on-site quality assessment. Electroluminescence imaging reveals many defects, such as macroscopic crystal or electrical contact defects, but quantitative comparison outside the laboratory without controlled environment is still difficult, especially for different detector technologies. Here, we show how this problem can be addressed by adding reference spots in the module area: One passive dark spot and an active bright spot composed of a high-power back-contacted silicon PV cell. Those reference spots are used to evaluate the module’s electroluminescence signal under different environmental conditions and to establish comparable results. Additionally, the comparison of images acquired with different camera technology detectors, such as silicon and InGaAs, is realised for signal levels. |
| Databáze: | OpenAIRE |
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