Universal mitigation of NBTI-induced aging by design randomization
| Autor: | Zainalabedin Navabi, Somayeh Sadeghi-Kohan, Maksim Jenihhin, Alexander Kamkin |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
010302 applied physics
Hardware architecture Engineering Negative-bias temperature instability Exploit business.industry SIGNAL (programming language) 02 engineering and technology 01 natural sciences 020202 computer hardware & architecture Embedded software Logic gate 0103 physical sciences 0202 electrical engineering electronic engineering information engineering Electronic engineering business Degradation (telecommunications) |
| Zdroj: | 2016 IEEE East-West Design & Test Symposium (EWDTS) EWDTS |
| DOI: | 10.1109/ewdts.2016.7807635 |
| Popis: | In this paper we propose to think out of the box and discuss an approach for universal mitigation of Negative Bias Temperature Instability (NBTI) induced aging untied from the limitations of its modelling. The cost-effective approach exploits a simple property of a randomized design, i.e., the equalized signal probability and switching activity at gate inputs. The techniques considered for structural design randomization involve both the hardware architecture and embedded software layers. Ultimately, the proposed approach aims at extending the reliable lifetime of nanoelectronic systems. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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