Observation of diffraction contrast in scanning helium microscopy
Autor: | David J. Ward, Andrew P. Jardine, John Ellis, Sam Lambrick, Hannah Sleath, Matthew Bergin |
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Přispěvatelé: | Apollo - University of Cambridge Repository, Lambrick, Sam [0000-0003-0720-6071], Ward, David [0000-0002-1587-7011] |
Jazyk: | angličtina |
Rok vydání: | 2020 |
Předmět: |
Diffraction
inorganic chemicals Materials science genetic structures media_common.quotation_subject 639/766/119 chemistry.chemical_element lcsh:Medicine Imaging techniques 02 engineering and technology 7. Clean energy 01 natural sciences Molecular physics 639/766/36/1120 chemistry.chemical_compound 0103 physical sciences Microscopy Physics::Atomic and Molecular Clusters Contrast (vision) Specular reflection Physics::Atomic Physics Condensed-matter physics 010306 general physics lcsh:Science Helium media_common Multidisciplinary 34 Chemical Sciences Scattering 639/766/930/2735 lcsh:R article Lithium fluoride 021001 nanoscience & nanotechnology chemistry Atomic and molecular collision processes 3406 Physical Chemistry Particle lcsh:Q 0210 nano-technology 51 Physical Sciences |
Zdroj: | Scientific Reports, Vol 10, Iss 1, Pp 1-8 (2020) Scientific Reports |
ISSN: | 2045-2322 |
DOI: | 10.1038/s41598-020-58704-1 |
Popis: | Scanning helium microscopy is an emerging form of microscopy using thermal energy neutral helium atoms as the probe particle. The very low energy combined with lack of charge gives the technique great potential for studying delicate systems, and the possibility of several new forms of contrast. To date, neutral helium images have been dominated by topographic contrast, relating to the height and angle of the surface. Here we present data showing contrast resulting from specular reflection and diffraction of helium atoms from an atomic lattice of lithium fluoride. The signature for diffraction is evident by varying the scattering angle and observing sharp features in the scattered distribution. The data indicates the viability of the approach for imaging with diffraction contrast and suggests application to a wide variety of other locally crystalline materials. |
Databáze: | OpenAIRE |
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