Autor: |
Kuindersma, P., Hoang, T., Schmitz, Jurriaan, Vijayaraghavan, M.N., Dijkstra, Mindert, Dijkstra, M., van Noort, W.A., Vanhoucke, T., Peters, W.C.M., Kramer, M.C.J.C.M. |
Rok vydání: |
2008 |
Předmět: |
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Zdroj: |
5th IEEE International Conference on Group IV Photonics, 2008, 256-258 STARTPAGE=256;ENDPAGE=258;TITLE=5th IEEE International Conference on Group IV Photonics, 2008 |
Popis: |
We present experimental and theoretical proof for a single and unique relationship between the breakdown voltage and power efficiency of visible light emitting devices fabricated in standard BiCMOS processes. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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