Correlation of magnetoresistive sensitivity mapping (MSM) with spin stand performance
| Autor: | J. Nathe, C. DeVries, M. Hansen, A. Schultz, D. Louder |
|---|---|
| Rok vydání: | 1999 |
| Předmět: |
Recording head
Materials science Microscope Magnetoresistance business.industry Giant magnetoresistance Signal Electronic Optical and Magnetic Materials law.invention Nuclear magnetic resonance law Optoelectronics Electrical and Electronic Engineering Magnetic force microscope business Sensitivity (electronics) Image resolution |
| Zdroj: | IEEE Transactions on Magnetics. 35:2571-2573 |
| ISSN: | 0018-9464 |
| DOI: | 10.1109/20.800894 |
| Popis: | Magnetoresistive sensitivity mapping (MSM) uses an AFM tip coated with a hard magnetic film as a flux source to provide a read sensitivity profile on a biased MR head. The resulting MSM signal is monitored using a modified electronics package attached to a standard probe microscope. MSM scans are compared with standard trackscans and /spl mu/-tracks of the same heads and are shown to detect the same anomalies in the read sensitivity profile. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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