Atomic Force Microscope Observation of Nano-Ordered Undulation Structure Formed by Bent-Shaped Molecules
| Autor: | Masatoshi Tokita, Xiaodong Li, Junji Watanabe, Susumu Edo, Sungmin Kang |
|---|---|
| Rok vydání: | 2009 |
| Předmět: |
Physics and Astronomy (miscellaneous)
Condensed matter physics Chemistry business.industry media_common.quotation_subject Bent molecular geometry General Engineering Phase (waves) General Physics and Astronomy Frustration Optics Amplitude Nano Polar Molecule business Layer (electronics) media_common |
| Zdroj: | Japanese Journal of Applied Physics. 48:030215 |
| ISSN: | 1347-4065 0021-4922 |
| DOI: | 10.1143/jjap.48.030215 |
| Popis: | The layer undulation, one of the frustration modes, in the X1 phase formed from the 4-bromo-1,3-benzene-bis[4-(4-alkoxyphenyliminomethyl)benzoate] was analyzed by Atomic force microscope (AFM) method. The AFM image shows a clear evidence of undulated layer structure in the homeotropically aligned sample. The layer undulation is observed as a mild sinusoidal wave with the periodic distance of 16–18 nm and the amplitude of 2–3 nm. Further, the undulation occurs in a random direction along the smectic layer, showing that the undulation direction is not related to the polar axis in the preceding B2 phase. |
| Databáze: | OpenAIRE |
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