Investigating the probe-tip influence on imaging using scanning near-field optical microscopy
| Autor: | Shan Shan Kou, Arif M. Siddiquee, Guangyuan Si, Panji Achmari, Jiao Lin, Brian Abbey |
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| Rok vydání: | 2021 |
| Předmět: |
Materials science
Scanning electron microscope business.industry Finite-difference time-domain method Physics::Optics Near and far field Surface plasmon polariton Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials law.invention Optics Optical microscope law Near-field scanning optical microscope Electrical and Electronic Engineering Transmission intensity Scanning tunneling microscope business Uncategorized |
| DOI: | 10.26181/608f61f819082 |
| Popis: | The influence of the near-field probe-tip on a model sample consisting of one-dimensional apertures is investigated using scanning near-field optical microscopy (SNOM). We use finite-difference time-domain (FDTD) simulations combined with SNOM scans to show that the probe-tip has a rather profound effect on the shape of the measured transmission intensity profiles. By taking into account the near-field perturbations introduced by the probe, our newly developed FDTD model facilitates the quantitative analysis of SNOM data and provides new insights into near-surface, subwavelength optical interactions. |
| Databáze: | OpenAIRE |
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