Parametric Built-In Test for 65nm RF LNA Using Non-Intrusive Variation-Aware Sensors

Autor: Emeric De Foucauld, Alexandre Siligaris, Haralampos-G. Stratigopoulos, Athanasios Dimakos, Salvador Mir
Přispěvatelé: Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS), Circuits Intégrés Numériques et Analogiques (CIAN), Laboratoire d'Informatique de Paris 6 (LIP6), Université Pierre et Marie Curie - Paris 6 (UPMC)-Centre National de la Recherche Scientifique (CNRS)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Centre National de la Recherche Scientifique (CNRS), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA), Laboratoire d'Electronique et des Technologies de l'Information (CEA-LETI), Université Grenoble Alpes (UGA)-Direction de Recherche Technologique (CEA) (DRT (CEA))
Jazyk: angličtina
Rok vydání: 2015
Předmět:
Engineering
business.industry
Process (computing)
020206 networking & telecommunications
02 engineering and technology
Automatic test pattern generation
[INFO.INFO-IA]Computer Science [cs]/Computer Aided Engineering
Low-noise amplifier
[INFO.INFO-MO]Computer Science [cs]/Modeling and Simulation
020202 computer hardware & architecture
Test (assessment)
[INFO.INFO-AI]Computer Science [cs]/Artificial Intelligence [cs.AI]
[SPI.TRON]Engineering Sciences [physics]/Electronics
0202 electrical engineering
electronic engineering
information engineering
Electronic engineering
[INFO.INFO-ES]Computer Science [cs]/Embedded Systems
Radio frequency
Electrical and Electronic Engineering
[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
business
Electronic circuit
Degradation (telecommunications)
Parametric statistics
Zdroj: Journal of Electronic Testing
Journal of Electronic Testing, Springer Verlag, 2015, 31 (4), pp.381-394. ⟨10.1007/s10836-015-5534-4⟩
Journal of Electronic Testing: : Theory and Applications
Journal of Electronic Testing: : Theory and Applications, 2015, 31 (4), pp.381-394. ⟨10.1007/s10836-015-5534-4⟩
ISSN: 0923-8174
1573-0727
Popis: International audience; Testing the RF functions of systems-on-chip incurs a very high cost. Built-in test is a promising alternative to facilitate testing and reduce cost. However, designing built-in test circuits that tap into the sensitive RF signal paths, in order to extract useful information for the purpose of testing, often finds the designers reluctant since it results in some performance degradation that needs to be accounted for during the design. In this paper, we study a transparent built-in test approach based on non-intrusive sensors that are not electrically connected to the RF circuit under test. The non-intrusive sensors simply monitor process variations and by virtue of this they are capable of tracking variations in the performances of the RF circuit as well. The alternate test paradigm is employed to map the outputs of the sensors to the performances, in order to replace the standard tests for measuring the performances directly. We discuss in this paper the principle of operation of these sensors and we demonstrate the non-intrusive test approach on a 65nm RF low noise amplifier.
Databáze: OpenAIRE
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