A consistent path for phase determination based on transmission electron microscopy techniques and supporting simulations
| Autor: | Lukas Konrad, John J. Rehr, Martina Lattemann, Christian Gspan, Haishuang Zhao, Gerald Kothleitner, Ute Kolb |
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| Rok vydání: | 2018 |
| Předmět: |
010302 applied physics
Diffraction Offset (computer science) Hard metal General Physics and Astronomy Structural diversity 02 engineering and technology Cell Biology Electron 021001 nanoscience & nanotechnology 01 natural sciences Hard metals Structural Biology Transmission electron microscopy 0103 physical sciences General Materials Science 0210 nano-technology Spectroscopy Biological system |
| Zdroj: | Micron (Oxford, England : 1993). 115 |
| ISSN: | 1878-4291 |
| Popis: | This work addresses aspects for the analysis of industrial relevant materials via transmission electron microscopy (TEM). The complex phase chemistry and structural diversity of these materials require several characterization techniques to be employed simultaneously; unfortunately, different characterization techniques often lack connection to yield a complete and consistent picture. This paper describes a continuous path, starting with the acquisition of 3D diffraction data - alongside classical high-resolution imaging techniques - and linking the structural characterization of hard metal industrial samples with energy-loss fine-structure simulations, quantitative electron energy-loss (EEL) and energy-dispersive X-ray (EDX) spectroscopy. Thereby, the compositional analysis of a MAX phase indicated an offset of the hydrogenic, theoretical sensitivity factors, originating from poorly-adjusted screening factors. In a next step, these results were matched against quantitative compositions and parameters obtained from X-ray spectroscopy data, carried out synchronously with EELS. |
| Databáze: | OpenAIRE |
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